CUBE - The Charge Sensitive Preamplifier for Radiation Detectors

CUBE is a family of single-channel low-noise charge sensitive preamplifiers built in CMOS technology and exclusively tailored for radiation detectors. The circuit is designed to offer the best noise performance at short peaking times enabling low dead time and high-count rate measurements with excellent energy resolution.

Main characteristics

  • Availability: bare die or on custom assembly
  • Physical size: 0.75 mm x 0.75 mm x 0.25 mm
  • Detector capacitance compatibility: from <0.25 pF to 10 pF
  • Reset mode: pulsed reset or continuous (with external resistor)

Applications

  • Silicon Drift Detectors (SDD)
  • Silicon PIN diode (Si-PIN)
  • High Purity Germanium (HpGE), CZT and CdTE detectors

The Bruker Cube product is manufactured and sold under licenses from Politecnico di Milano (patents JP2012-172331, JP2012-172332) and Oxford Instruments (patents EP2710733B, GB2491111B, US9397626 and JP6441675)

 

CUBE Schematic

CUBE Spectroscopic performance

Technical Data

CUBE VersionPolarityDetector capacitance [pF]Feedback capacitance [fF]ENC (CUBE only, 3.6 eV/e)Main application
PRE_016Negative (electrons)< 0.25253.3 e- @ 1 μsSilicon Drift Detector (SDD)
PRE_031Negative (electrons)< 0.5253.3 e- @ 1 μsHpGe, CdTe or CZT
PRE_033Negative (electrons)<0.25252.4e- @ 1usSilicon Drift Detector (SDD)
PRE_037Positive (holes)< 0.70254.0e- @1usSi-PIN, HpGe, Strip or Pixelated detectors, X-ray application
PRE_038Positive (holes)0.50 - 3.005012.3 e- @1usSi-PIN, HpGe, Strip or Pixelated detectors, X-ray application
PRE_039Positive (holes)3.00-10.005020.2e- @1usSi-PIN, HpGe, Strip or Pixelated detectors, X-ray application
PRE_040Negative (electrons)0.50-3.005012.4e- @1usHpGe, CdTe or CZT, Strip or Pixelated detectors, X-ray application
PRE_041Both (selectable)3.00-10.0050057 e- @1usHpGe, HpGe Cylindrical, CdTe or CZT, Strip, Hard X-ray or Gamma application
PRE_042Both (selectable)0.50-3.0050035.5 e- @1usHpGe, HpGe Cylindrical, CdTe or CZT, Strip, Hard X-ray or Gamma application

Contact us








Submitting this form you are accepting our Privacy Policy


News & Events

Licence agreement with Oxford Instruments regarding Cube

Berlin, Germany, October 7, 2020 - Bruker and Oxford Instruments have announced that they have reached a settlement on a patent related issue with Bruker’s Cube product The agreement licences...

Learn more

XGLab Partecipates at 2019 APS/CNM User Meeting

XGLab participates at 2019 APS/CNM User Meeting taking place in Argonne, Illinois, USA, from the 6th to the 10th May...

Learn more

XGLab Partecipates at 68th annual Denver X-RAY Conference

XGLab participates at 68th annual Denver X-ray Conference taking place in Lombard, Illinois, USA, from the 5th to the 9th August...

Learn more