CUBE - The Charge Sensitive Preamplifier for Radiation Detectors
CUBE is a family of single-channel low-noise charge sensitive preamplifiers built in CMOS technology and exclusively tailored for radiation detectors. The circuit is designed to offer the best noise performance at short peaking times enabling low dead time and high-count rate measurements with excellent energy resolution.
Main characteristics
- Availability: bare die or on custom assembly
- Physical size: 0.75 mm x 0.75 mm x 0.25 mm
- Detector capacitance compatibility: from <0.25 pF to 10 pF
- Reset mode: pulsed reset or continuous (with external resistor)
Applications
- Silicon Drift Detectors (SDD)
- Silicon PIN diode (Si-PIN)
- High Purity Germanium (HpGE), CZT and CdTE detectors
The Bruker Cube product is manufactured and sold under licenses from Politecnico di Milano (patents JP2012-172331, JP2012-172332) and Oxford Instruments (patents EP2710733B, GB2491111B, US9397626 and JP6441675)
CUBE Schematic
CUBE Spectroscopic performance
Technical Data
| CUBE Version | Polarity | Detector capacitance [pF] | Feedback capacitance [fF] | ENC (CUBE only, 3.6 eV/e) | Main application |
|---|---|---|---|---|---|
| PRE_016 | Negative (electrons) | < 0.25 | 25 | 3.3 e- @ 1 μs | Silicon Drift Detector (SDD) |
| PRE_031 | Negative (electrons) | < 0.5 | 25 | 3.3 e- @ 1 μs | HpGe, CdTe or CZT |
| PRE_033 | Negative (electrons) | <0.25 | 25 | 2.4e- @ 1us | Silicon Drift Detector (SDD) |
| PRE_037 | Positive (holes) | < 0.70 | 25 | 4.0e- @1us | Si-PIN, HpGe, Strip or Pixelated detectors, X-ray application |
| PRE_038 | Positive (holes) | 0.50 - 3.00 | 50 | 12.3 e- @1us | Si-PIN, HpGe, Strip or Pixelated detectors, X-ray application |
| PRE_039 | Positive (holes) | 3.00-10.00 | 50 | 20.2e- @1us | Si-PIN, HpGe, Strip or Pixelated detectors, X-ray application |
| PRE_040 | Negative (electrons) | 0.50-3.00 | 50 | 12.4e- @1us | HpGe, CdTe or CZT, Strip or Pixelated detectors, X-ray application |
| PRE_041 | Both (selectable) | 3.00-10.00 | 500 | 57 e- @1us | HpGe, HpGe Cylindrical, CdTe or CZT, Strip, Hard X-ray or Gamma application |
| PRE_042 | Both (selectable) | 0.50-3.00 | 500 | 35.5 e- @1us | HpGe, HpGe Cylindrical, CdTe or CZT, Strip, Hard X-ray or Gamma application |
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News & Events
Licence agreement with Oxford Instruments regarding Cube
Berlin, Germany, October 7, 2020 - Bruker and Oxford Instruments have announced that they have reached a settlement on a patent related issue with Bruker’s Cube product The agreement licences...Learn more
XGLab Partecipates at 2019 APS/CNM User Meeting
XGLab participates at 2019 APS/CNM User Meeting taking place in Argonne, Illinois, USA, from the 6th to the 10th May...Learn more
XGLab Partecipates at 68th annual Denver X-RAY Conference
XGLab participates at 68th annual Denver X-ray Conference taking place in Lombard, Illinois, USA, from the 5th to the 9th August...Learn more
