News
26/02/2013
SEM microanalysis + On-X
"On-X" is unique and innovative miniaturized electron detector placed on the top of EDS SDD based X Ray detector. EDX-8100 (X Ray) and On-X (electron) combine to provide perfectly correlated x ray maps and morphological images. Read more about this new technology in the product webpage.

XGLab participates at IEEE NSS-MIC 2018
XGLab participates at IEEE NSS-MIC 2018 taking place in Sydney, Australia, from the 10st to the 17th November 2018.


XGLab participates at EXRS 2018
XGLab participates at XGLab participates at EXRS 2018 taking place in Ljubljana, Slovenia, from the 24st to the 29th June 2018.


XGLab participates at IEEE NSS-MIC 2017
XGLab participates at IEEE NSS-MIC 2017 taking place in Atlanta, USA, from the 21st to the 28th October 2017.


XGLab sponsor of ICOM CC 2017
XGLab is sponsor of ICOM CC 2017 taking place in Copenhagen (DK) on 4th-8th September 2017.


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diagnostics of cultural heritage, gamma camera, non-destructive investigation, non-destructive testing, x ray detectors,x-ray detectors, x ray detector, x-ray detector, XRF analyzer, XRF detector, portable XRF analyzer, Portable XRF, gamma detection, silicon drift detector, drif detector, silicon drif detectors, PXRF, drit detectors, CCD electronics