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Products

XGL-MCSH-3100:
MULTI-CHANNEL ANALYZER WITH SHAPING AMPLIFIER

A complete Multi-Channel Analyzer equipped with a shaping amplifier and a USB interface to PC, optimized for Silicon Drift Detectors (SDDs).

XGL-MCSH-3100 PERFORMANCES:

  • It allows best spectroscopic performances.
  • Maximum measured throughput:
    0.9 Mcps @ 150ns shaping time
    3 Mcps @ 50ns shaping time
  • Shaping Amplifier: 5th order semi-gaussian
  • Two shaping time selection:
    1µs (for spectroscopy requiring high energy resolution), 250ns (for spectroscopy at high count rate).
    The shaping time is customable on request from 100ns to 10µs.
    Gain regulation. Pole-zero compensation. Built-in Base Line Restorer and Pile Up Rejector.
    Record spectroscopic performances have been obtained with this unit feed by the XGL-CPA-2100.
  • USB 2.0 interface
  • User Interface and control software on Windows OS.
  • Libraries available for easy interfac
  • ADC: Resolution: 14bit, Max conversion rate: 10MSPS, Integral Nonlinearity Error: 2.5 LSB, Differential Nonlinearity Error: 0.6 LSB)
  • FPGA - XILINX SPARTAN-3E: 500k system gates, 48MHz.

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XGL-MCSH-3100
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XGL-MCSH-3100
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XGLab participates at IEEE NSS-MIC 2019
XGLab participates at IEEE NSS-MIC 2019 taking place in Manchester, UK, from the 26th October to the 2nd November 2019.


XGLab participates at 68th annual Denver X-ray Conference
XGLab participates at 68th annual Denver X-ray Conference taking place in Lombard, Illinois, U.S.A., from the 5th to the 9th August 2019.


XGLab participates at 2019 APS/CNM User Meeting
XGLab participates at 2019 APS/CNM User Meeting taking place in Argonne, Illinois, U.S.A., from the 6th to the 10th May 2019.


XGLab participates at IEEE NSS-MIC 2018
XGLab participates at IEEE NSS-MIC 2018 taking place in Sydney, Australia, from the 10th to the 17th November 2018.


XGLab participates at EXRS 2018
XGLab participates at XGLab participates at EXRS 2018 taking place in Ljubljana, Slovenia, from the 24st to the 29th June 2018.


XGLab participates at IEEE NSS-MIC 2017
XGLab participates at IEEE NSS-MIC 2017 taking place in Atlanta, USA, from the 21st to the 28th October 2017.


XGLab sponsor of ICOM CC 2017
XGLab is sponsor of ICOM CC 2017 taking place in Copenhagen (DK) on 4th-8th September 2017.


diagnostics of cultural heritage, gamma camera, non-destructive investigation, non-destructive testing, x ray detectors,x-ray detectors, x ray detector, x-ray detector, XRF analyzer, XRF detector, portable XRF analyzer, Portable XRF, gamma detection, silicon drift detector, drif detector, silicon drif detectors, PXRF, drit detectors, CCD electronics