XGL-EDX-8100 + «On-X»
SDD based MicroAnalysis for SEM and Microprobes
XGLab, in cooperation with PulseTor LLC, provides EDX micro-analysis solutions for Scanning Electron Microscopes and Microprobes. The superior performance of Silicon Drift Detectors and Pulse Processor make this product a top performance solution for your system.
"On X" solution: a miniaturized Electron Back Scattered Detector (based on scintillator on SiPM technology[1]) mounted directly on the EDX detector (thus exploiting the same solid angle), providing additional information on the sample.
[1] “Scintillator on Silicon Photomultiplier Coupled Pair Backscattered Electron Detector”, N. Barbi (PulseTor LLC), Microscopy and Microanalysis 2011, Nashville, TN, USA
Main features:
Detector
- 129 eV Resolution without Liquid Nitrogen.
- Capable of 10-X Increased Data Throughput at elevated beam currents thanks to SDD and Digital Pulse Processor.
- Ultra-thin Window for Efficient Light Element Analysis.
- Optional add-on: "On X" system.
Software
- Full spectral imaging. All x-ray events at every pixel are stored by the computer.
- Elements for mapping may be selected before, during or after data acquisition.
- Maps generated with multiple sweeps of the beam. Allows user to see map developing over time.
- Generation of spectrum from any user-specified point or region in map.
- Comprehensive built-in report editor.
XGLab at DXC 2012
XGLab will attend Denver X Ray Conference in Colorado from 6th to 10th August 2012.
XGLab at EXRS 2012
Visit new XGLab products at EXRS 2012 in Wien from 18th to 22nd June.
THE CUBE: A NEW BREAKING TECHNOLOGY BY XGLab
XGLab introduces CUBE, a breaking technology that enhances the radiation detectors performance.
